Electron energy-loss spectrometry for metals : some thoughts beyond microanalysisSCHATTSCHNEIDER, P; HEBERT, C; STÖGER-POLLACH, M et al.International journal of materials research. 2006, Vol 97, Num 7, pp 920-927, issn 1862-5282, 8 p.Article

Digital filtering in electron energy loss spectroscopy (EELS)HOSOI, J; OIKAWA, T; INOUE, M et al.Journal of electron microscopy. 1985, Vol 34, Num 1, pp 1-7, issn 0022-0744Article

Weighted least squares estimation of background in EELS imagingPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1985, Vol 137, Num 1, pp 93-100, issn 0022-2720Article

Optimized acquisition parameters and statistical detection limit in quantitative EELSPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1984, Vol 135, Num 3, pp 295-316, issn 0022-2720Article

Numerical aspects of the deconvolution of angle-integrated electron energy-loss spectraSU, D. S; SCHATTSCHNEIDER, P.Journal of microscopy (Print). 1992, Vol 167, pp 63-75, issn 0022-2720, 1Article

A new variable-angle intermediate-energy low-resolution electron energy loss spectrometerDE SOUZA, G. G. B; DE SOUZA, A. C. A. E.Journal of physics. E. Scientific instruments. 1985, Vol 18, Num 12, pp 1037-1039, issn 0022-3735Article

Effect of accelerationg voltage and thickness on an effective signal-to-noise ratio in electron energy loss spectroscopyBOTTON, G; L'ESPERANCE, G.Ultramicroscopy. 1992, Vol 41, Num 4, pp 287-290, issn 0304-3991Article

Methodology for spectrum evaluation in quantitative electron energy-loss spectrometry using the Zeiss CEM902VAN PUYMBROECK, J; JACOB, W; VAN ESPEN, P et al.Journal of microscopy (Print). 1992, Vol 166, pp 273-286, issn 0022-2720, 3Article

Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometerEGERTON, R. F; YANG, Y.-Y; CHENG, S. C et al.Ultramicroscopy. 1993, Vol 48, Num 3, pp 239-250, issn 0304-3991Article

A new background substration for low-energy EELS core edgesTENAILLEAU, H; MARTIN, J. M.Journal of microscopy (Print). 1992, Vol 166, pp 297-306, issn 0022-2720, 3Article

Spatial resolution energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 133-144, issn 0304-3991Conference Paper

A study of an inhomogeneous gradient magnetic field spectrometer with a curvilinear axisXIMEN JIYE; ZHIFENG SHAO.Optik (Stuttgart). 1985, Vol 71, Num 2, pp 73-79, issn 0030-4026Article

Elastic scattering in eels ― fundamental corrections to quantificationBOURDILLON, A. J; STOBBS, W. M.Ultramicroscopy. 1985, Vol 17, Num 2, pp 147-149, issn 0304-3991Article

Electron energy-loss spectroscopyCHESTERS, M. A; SHEPPARD, N.Advances in spectroscopy (1986). 1988, Vol 16, pp 377-412, issn 0892-2888Article

Eine schnelle Methode zur Berechnung des Bremsstrahlungsuntergrundes für die energiedispersive Elektronenstrahl-Mikroanalyse = Une méthode rapide de calcul du rayonnement de freinage pour spéctrométrie d'électron à perte d'énergie = A fast method for calculation of bremsstrahlung background in energy dispersive electron-probe microanalysisEGGERT, F.Experimentelle Technik der Physik. 1985, Vol 33, Num 5, pp 441-448, issn 0014-4924Article

Towards a practical method for EELS quantificationHOFER, F; LUO, B.Ultramicroscopy. 1991, Vol 38, Num 2, pp 159-167, issn 0304-3991Article

A novel, double-focusing spectrometer for translational-energy-loss spectroscopyBEYNON, J. H; BRENTON, A. G; TAYLOR, L. C. E et al.International journal of mass spectrometry and ion processes. 1985, Vol 64, Num 2, pp 237-244, issn 0168-1176Article

A single-stage process for quantifying electron energy-loss spectraSTEELE, J. D; TICHMARSH, J. M; CHAPMAN, J. N et al.Ultramicroscopy. 1985, Vol 17, Num 3, pp 273-276, issn 0304-3991Article

Design of a high-dispersion magnetic spectrometer for EELSYOSHIDA, K; URA, K; MATSUDA, H et al.Optik (Stuttgart). 1985, Vol 71, Num 1, pp 11-14, issn 0030-4026Article

Development of dispersion compensation for use in high-resolution electron-energy-loss spectroscopyKEVAN, S. D; DUBOIS, L. H.Reviews of modern physics. 1984, Vol 55, Num 10, pp 1604-1612, issn 0034-6861Article

Iterative reduction of gain variations in parallel electron energy loss spectrometrySCHATTSCHNEIDER, P; JONAS, P.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 179-188, issn 0304-3991Article

A differentially pumped electron-energy-loss spectrometer with multichannel detector for time-resolved studies at intermediate ambient pressuresLORRAINE, P. W; THOMS, B. D; HO, W et al.Review of scientific instruments. 1992, Vol 63, Num 2, pp 1652-1670, issn 0034-6748Article

Investigation and use of plasmon losses in energy-filtering transmission electron microscopyFROMM, I; REIMER, L; RENNEKAMP, R et al.Journal of microscopy (Print). 1992, Vol 166, pp 257-271, issn 0022-2720, 3Article

PLural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting alpertureEGERTON, R. F; WANG, Z. L.Ultramicroscopy. 1990, Vol 32, Num 2, pp 137-147, issn 0304-3991, 11 p.Article

Slow electron-energy-loss spectroscopy for surface microanalysisNASSIOPOULOS, A. G; CAZAUX, J.Surface science. 1985, Vol 149, Num 2-3, pp 313-325, issn 0039-6028Article